NanoXtract: Nanomaterials Image Analysis Tool
Computation
User Guide
Download demo image
Step
Image
Image upload
upload
Please select an image
NM type
Circular
Cylindrical
Plates
Other
Comp. Branches
With and without outliers
With outliers only
Activate Capture
Measuered length (nm)
Line length (pixels)
pxls/nm ratio
Reduction of noise
X dimension sigma
Y dimension sigma
Thresholding
Method
Huang
Intermodes
Isodata
Li
Max Entropy
Mean
Minimum Error
Minimum
Moments
Otsu
Percentile
Renyi Entropy
Shanbag
Triangle
Yen
Manual
Threshold Value
Labeling improvement
Distance Merge Threshold
Gauss Size
Size Merge Threshold
Filtering
Minimum Segment Area (pixels)
Maximum Segment Area (pixels)
Statistically processed image end result
Automatically remove outliers
Description
Values
Standard Deviation
Descriptors mean values
Descriptors per component
*This work received funding from the European Union's Horizon 2020 research and innovation program via
NanoSolveIT project
under grant agreement number 814572
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